Abstract Advanced analysis techniques are important tools for revealing the micro world. It is also important for students to learn micro scale dimension. Contrary to that of the traditional optical microscopy and electronic microscopy, the observation of the morphology of a sample by atomic force microscopy is based on the atomic force interaction between the tip and the sample. This article briefly describes the basic principle and basic structure of atomic force microscopy, and explains its core components and functions. There are four main operating modes for atomic force microscopy. This article compares their advantages and disadvantages and their applications. Finally, the practical application of atomic force microscopy in analysis is briefly described, demonstrating the superiority and broad application prospects of atomic force microscopy.
